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A mobile data acquisition and reduction system utilizing a minicomputer is discussed. In detail, a crack initiation fatigue computer program is presented with explanations of the systems structure, theoretical considerations, numerical analysis techniques and data handling procedures. The results are compared with data from the SAE Fatigue Design and Evaluation Committee's Cumulative Fatigue Damage Test Program.

THREE SIMPLIFIED PROCEDURES for predicting fatigue life are compared with actual test results. The part geometry, load histories, material properties, and test results used in these analyses were obtained from the SAE Fatigue Design and Evaluation Committee's Cumulative Fatigue Damage Test Program (1)*. The purpose of this effort is to evaluate the relative accuracy and applicability of these frequently used methods.

This paper traces the development of small field data acquisition and analysis systems. The impact of some significant recent advances in microelectronics on the design of field test systems is detailed. Techniques for the exploitation of newly developed microelectronic devices to design field test systems based on the concepts of distributed computing and modular hardware and software organization are discussed. The paper concludes with a description of a recently developed test system which embodies the newly available capabilities.

Methods for assessing the variability of fatigue lives of components subjected to variable amplitude loading are described. Monte Carlo simulations are coupled with the local stress strain approach to compute the distribution of fatigue lives that includes uncertainties in loading, material properties, geometry and fatigue damage.