Techniques for Suspect/Counterfeit EEE Parts Detection by X-Ray Fluorescence Test Methods
AS6171/3
XRF technique for counterfeit detection is applicable to electrical, electronic and electromechanical (EEE) parts as listed in AS6171 General Requirements. In general, the detection technique is meant for use on piece parts prior to assembly on a circuit board or on the parts that are removed from a circuit board. The applicability spans a large swath of active, passive and electromechanical parts.
If AS6171/3 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
Rationale:
Since counterfeit electrical, electronic, and electromechanical (EEE) components are likely to have some level of material difference from the genuine components, techniques that identify the chemical elements in different areas of a part are essential to benchmarking authentic parts (exemplars) and comparing them to parts under consideration. X-ray fluorescence (XRF) is one such technique that can be applied both to the external surfaces and internal elements of a part. The method itself is nondestructive by nature.
AS6171/3 has been reaffirmed to comply with the SAE Five-Year Review policy.
Related Topics:
Defense industry
Nanomaterials
Counterfeit parts
Coatings, colorants, and finishes
Materials identification
Data acquisition and handling
Test procedures
Test facilities
Also known as: SAE AS 6171/3
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