Rapid Evaluation of Hermetic Seals in Automotive Microelectronic Packages Using Shearography 960975
As the use of electronic devices in automobiles increases, the reliability of such devices is becoming increasingly important. One possible failure is due to leakage resulted from imperfect hermetical seal in mircochips and microelectronic packages. This paper presents an optical technique referred to as shearography for rapid evaluation of hermetics seals. The proposed process of leaking testing is very fast and practical.
Citation: Hung, Y. and Shi, D., "Rapid Evaluation of Hermetic Seals in Automotive Microelectronic Packages Using Shearography," SAE Technical Paper 960975, 1996, https://doi.org/10.4271/960975. Download Citation
Author(s):
Y. Y. Hung, Dahuan Shi
Affiliated:
Oakland Univ.
Pages: 8
Event:
International Congress & Exposition
ISSN:
0148-7191
e-ISSN:
2688-3627
Also in:
Trends in Testing and Instrumentation-SP-1130, SAE 1996 Transactions - Journal of Passenger Cars-V105-6
Related Topics:
Seals and gaskets
Optics
Reliability
Logistics
SAE MOBILUS
Subscribers can view annotate, and download all of SAE's content.
Learn More »
