Measurement of Hemispherical Total Emittance in Cryogenic Temperature 941484
Measurement of hemispherical total emittance, ε H material for cryogenic engineering in the temperature range of 10∼50K is proposed. This measurement is based on calorimetric method and ε H is obtained by measuring a sample temperature corresponding to heat input to a sample heater. In order to verify this method, the parameter ε H is analyzed for a test chamber by using a thermal mathematical model.
