Precision Location of Hidden Edges in Manufacturing Using a Compact X-ray Backscatter Gauge 2000-01-3010
A compact x-ray backscatter gauge has been developed to detect hidden edges of substructure and precisely determine edge distances prior to drilling. The portable system can be mounted at the drill for automated operation or used as a hand-held unit for manual operation. The gauge requires access to only one side of the assembly and can operate either in contact with the surface or held off the surface by as much as 10 mm. The system is capable of locating edges hidden under either a metallic or composite skin and maintaining edge distance tolerances within approximately a quarter of a mm.
Citation: Bullen, G. and Schulte, R., "Precision Location of Hidden Edges in Manufacturing Using a Compact X-ray Backscatter Gauge," SAE Technical Paper 2000-01-3010, 2000, https://doi.org/10.4271/2000-01-3010. Download Citation
