Technical Paper
SAFT Nickel-Cadmium Lifetime and Reliability
1992-08-03
929327
The first part of this document gives the reliability number for SAFT cells. This calculation covers the entire SAFT NiCd cell experience: on ground and on board satellites under LEO and GEO conditions. The second part describes a lifetime model. This model is based on a Weibull distribution and the Arrhenius law, taking into account the following parameters: Temperature, DOD, percentage of failed cells and overcharge current.
