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The purpose of the Los Alamos High-Energy Neutron Testing Handbook is to provide user information and guidelines for testing Integrated Circuits (IC) and electronic systems at the Irradiation of Chips and Electronics (ICE) Houses at the Los Alamos Neutron Science Center (LANSCE) at Los Alamos National Laboratory (LANL). Microelectronic technology is constantly advancing to higher density, faster devices and lower voltages. These factors may increase device susceptibility to radiation effects. The high-energy neutron source at LANSCE/LANL provides the capability for accelerated neutron testing of semiconductor devices and electronic systems and to simulate effects in various neutron environments.

Natural atmospheric radiation effects have been recognized in recent years as key safety and reliability concerns for avionics systems. Atmospheric radiation may cause Single Event Effects (SEE) in electronics. The resulting Single Event Effects can cause various fault conditions, including hazardous misleading information and system effects in avionics equipment. As technology trends continue to achieve higher densities and lower voltages, semiconductor devices are becoming more susceptible to atmospheric radiation effects. To ensure a system meets all its safety and reliability requirements, SEE induced upsets and potential system failures need to be considered. The purpose of this paper is to describe a process to incorporate the SEE analysis into the development like-cycle. Background on the atmospheric radiation phenomenon and the resulting single event effects, including single event upset (SEU) and latch up conditions is provided.

Atmospheric Neutron Single Event Effects (SEE) are widely known to cause failures in all electronic hardware, and cause proportionately more failures in avionics equipment due to the use altitude. In digital systems it is easy to show how SEE can contribute several orders of magnitude more faults than random (hard) failures. Unfortunately, current avionics Safety assessment methods do not require consideration of faults from SEE. AVSI SEE Task Group (Aerospace Vehicle Systems Institute Committee #72, on Mitigating Radiation Effects in Avionics) is currently coordinating development of an atmospheric Neutron Single Event Effects (SEE) Analysis method. This analysis method is a work in progress, in close collaboration with SAE S-18 and WG-63 Committees (Airplane Safety Assessment Committee). The intent is to include this method as part of current revisions to ARP4761 (Guidelines and Methods for Conducting the Safety Assessment Process on Civil Airborne Systems and Equipment).