Technical Paper
Design for Reliability: Overview of the Systemic Approach for Failure Analysis in Electronics
2011-10-04
2011-36-0056
This paper approaches failure analysis in electronics under design for reliability (DfR) point of view. Some real cases illustrate how stress/strength interference (SSI) plays an important role to understand the component failure under the perspective of strength variation within a lot, from lot to lot and from manufacturer to manufacturer and likewise, the stress applied may vary with temperature, vibration etc. Also, the paper stresses the necessity to go beyond classical reliability practice, generally associated with minimizing catastrophic failures.
