Technical Paper
Zth Thermal Modelling of MOSFET in Sub-Milliseconds Range
2004-03-08
2004-01-1684
1 An FEA (Finite Element Analysis) model was developed based on the physical dimension of the MOSFET device to produce a Zth curve closely matching the experimental Zth curve. This Finite Element Analysis model would then be extrapolated down to the region beyond the capability of the hardware of the Zth measurement system
