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Quality, Reliability, Durability (QRD) and Safety of vehicular Electrical/Electronics (E/E) systems traditionally have resulted from arduous rounds of Design-Built-Test-Fix (DBTF) Reliability and Durability Growth Testing. Such tests have historically required 12-16 or more weeks of Accelerated Life Testing (ALT), for each round of validation in a new product development program. Challenges have arisen from: The increasing number of E/E modules in today's vehicle places a high burden on supplier's test labs and budgets. The large size and mass of electric vehicle power modules results in a lower test acceleration factors which can extend each round of ALT to 5-6 months. Durability failures tend to occur late in life testing, resulting in the need to: perform a root cause investigation, fix the problem, build new prototype parts and then repeat the test to verify problem resolutions, which severely stress program budgets and schedules.