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Technical Paper

Source Management of Aircraft Electrical Power Systems with Hardware in the Loop Verification

2017-09-19
2017-01-2034
Future aircraft will demand a significant amount of electrical power to drive primary flight control surfaces. The electrical system architecture needed to source these flight critical loads will have to be resilient, autonomous, and fast. Designing and ensuring that a power system architecture can meet the load requirements and provide power to the flight critical buses at all times is fundamental. In this paper, formal methods and linear temporal logic are used to develop a contactor control strategy to meet the given specifications. The resulting strategy is able to manage multiple contactors during different types of generator failures. In order to verify the feasibility of the control strategy, a real-time simulation platform is developed to simulate the electrical power system. The platform has the capability to test an external controller through Hardware in the Loop (HIL).
Technical Paper

Sputtered Barium Titanate, Lead Zirconate Titanate, Barium Strontium Titanate Films for Capacitor Applications

2000-10-31
2000-01-3653
Thin barium titanate(BT), lead zirconate titanate(PZT), barium strontium titanate(BST) films are being developed for use in microelectronics, electromechanical and optoelectronic applications. Thin BaTiO3, Pb(ZrTi)O3 and (BaSr)TiO3 film capacitor devices were fabricated using RF sputtering techniques. The typical dielectric constant of these film capacitors was in the range of 300 to 1140. These film capacitors had dissipation factors between 0.2% to 0.6 % before annealing and 4-6% after annealing. The film capacitors have breakdown voltages in the range of 1×105 V/cm to 1.2×106 V/cm. The resistivity was in the range of 1010 to 1012 ohm-cm before annealing and 1013 to 1014 ohm-cm after annealing. The capacitance of films produced to-date had little dependence on frequency. Thermal cycling in the temperature range of 50 to 300°C had very limited impact on the capacitance and dissipation factor. Measurements of dielectric and material properties are reported.
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